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17 - 22 mars 2024, Carry-le-Rouet

 Xtop 2024

We are happy to announce that the 15th XTOP Biennial Conference of High Resolution X-ray Diffraction and Imaging - will be held in Carry le Rouet, close to Marseille. The first XTOP conference took place in Marseille in 1992. The main scope of the conference was set already in 1992 to X-ray topography and high resolution diffraction, however during the time the conference has covered also other related topics like x-ray tomography, phase sensitive scattering, scanning techniques etc.

XTOP brings together scientists from the fields of X-ray diffractometry, reflectometry, standing waves, coherent and conventional X-ray diffraction imaging and topography, as well as X-ray absorption and phase contrast imaging. XTOP is thus one of the central scientific conference concerning methods and instrumentation in laboratory and synchrotron-based high-resolution X-ray diffraction methods, phase contrast imaging, and micro-tomography.


  • Imaging(full field and scanning microscopy; phase contrast imaging; coherent diffraction imaging; high resolution diffraction imaging, topography).
  • Probing matter with coherent X-rays.
  • Theory: Crystal theory versus experiments, high throughput computing, phase retrieval, statistical approaches, deep learning, AI.
  • Crystal defects: theory vs experiment.
  • Strain and stress analysis.
  • Industrial applications with X-ray scattering.
  • In situ & operando experiments.
  • SAXS, reflectivity, grazing incidence scattering.


  • 17th to 22nd of March 2024



  • Opening date for the submission of abstracts: 01/10/2023.
  • Deadline for submission of abstracts: 15/11/2023.
  • Opening of the registration: beginning of November 2023.
  • Answer to authors: 1st December 2023.
  • Early bird registration deadline: 15/12/2023.
  • Deadline for late registration: February 2024.