@AFC_cristal
Symposium CM3 of the MRS Spring Meeting in 2018 is dedicated to the analysis of nanostructures with X-rays. The last decade has seen a tremendous evolution of X-ray imaging and microscopy. This has been driven by the rapid development of third and fourth generation X-ray facilities and X-ray optics capable of producing coherent beams routinely below 100 nm in size. The high penetrating power, extreme sensitivity of X-rays to strain and defects and the tunability of these new sources to access X-ray fluorescence of much of the periodic table has enabled in situ or operando studies of nano-scale properties materials. It is worth also emphasizing that small X-ray beams may also be used to induce an electrical current or light emission in the nano-object enabling enhanced scanning probe and photo excitation studies.
Beyond a discussion of the methods which have been developed, and are still an object of active research (coherent diffraction imaging in forward or Bragg conditions, nano X-ray fluorescence imaging, micro-Laue diffractiion ...), this symposium aims to disseminate knowledge of these new tools to a broader community of materials scientists.
The range of materials science topics is indeed very large: nanostructures (nanowires, nano-islands) play a role in electronic, and optoelectronic devices, photovoltaic applications, catalysis, energy harvesting and storage, and even structural materials.
In all these areas, being able to investigate local structure-function relationships at the nano-scale during operation is a fundamental issue. The techniques described above have begun to make a major impact on these fundamental materials science questions. Invited speakers, as well as the growing community of X-ray facility users, will present a complete overview of the capabilities and science being engaged with X-ray imaging and microscopy. These capabilities are only going to grow with the new, high brightness, synchrotrons appearing and being planned worldwide.
- X-ray Imaging and Microscopy developments
- Coherent X-ray diffraction imaging
- Laue diffraction microscopy
- X-ray fluorescence microscopy
- Full field diffraction X-ray microscopy
- Materials science utilizing the methods:
- Strain mapping and engineering
- Nanowires (metals, oxides, semiconductors)
- In situ or operando studies
- Mechanical properties at the nanoscale
- Optoelectronic properties of nanowires
- X-ray nanodiffraction
- Electrical properties of nanowires