@AFC_cristal
The training will cover many aspects of "Combined Analysis" by X-ray and neutron scattering, ranging from fundamental requirements to technically relevant industrial and academic applications : Diffraction technique - an overview, crystallography Texture Analysis, Residual Stress Analysis, Rietveld analysis, Reflectivity analysis, Phase analysis, Phase and line broadening analysis, The combined solution, XRD and XRF combined analysis, Electron Microscopy, using MAUD software.More information and inscriptions on the website of the workshop.
Organisers:
Daniel Chateigner Professor, CRISMAT Laboratory, Caen, France : scientific coordinator,
Eric Berthier, THERMO FISHER SCIENTIFIC company, INEL brand : organization coordinator,