3-8 juillet 2017 - Caen
The 8th session of this workshop will take place in Caen France from July 3rd to July 8th, 2017. This international school will cover many aspect of the “Combined Analysis” by X-ray, neutron and electron scattering and X-ray fluorescence applied to material science, ranging from fundamental requirements to technically relevant industrial and academic applications.
The combined analysis method has been developed over the years starting from the Rietveld method, extending it to most of the powder diffraction analyses and more recently incorporating, on the same idea, other techniques such as reflectivity, X-ray fluorescence and electron diffraction.
The aim is to give students as well as academic and non-academic researchers the necessary information and tolls to be able to characterize their own materials and samples using the combined analysis method and the software MAUD. The characterization involves obtaining information on the structure, microstructure, phase and elemental content, texture, stress in different kind of samples and structures including : thin films, bulk materials, anisotropic materials, polyphased materials, nano-materials, etc. The objective is to bring together participants from various fields and to provide an opportunity to discuss individual interests and experience.
The training will cover many aspects of "Combined Analysis" by X-ray and neutron scattering, ranging from fundamental requirements to technically relevant industrial and academic applications :
- Diffraction techniques - an overview
- Crystallographic Texture Analysis
- Residual Stress Analysis
- Rietveld analysis
- Reflectivity analysis
- Phase analysis
- Phase and line broadening analysis
- The combined solution
- XRD and XRF combined analysis
- Electron Microscopy
- Using MAUD software...
More information on the website of the workshop.